Dry etching


Dry etching refers to the removal of material, typically a masked pattern of semiconductor material, by exposing the material to a bombardment of ions that dislodge portions of the material from the exposed surface. A common type of dry etching is reactive-ion etching. Unlike with many of the wet chemical etchants used in wet etching, the dry etching process typically etches directionally or anisotropically.

Applications

Dry etching is used in conjunction with photolithographic techniques to attack certain areas of a semiconductor surface in order to form recesses in material, such as contact holes or via holes or to otherwise remove portions of semiconductor layers where predominantly vertical sides are desired. Along with semiconductor manufacturing, micromachining and display production, the removal of organic residues by oxygen plasmas is sometimes correctly described as a dry etch process. The term plasma ashing can be used instead.
Dry etching is particularly useful for materials and semiconductors which are chemically resistant and could not be wet etched, such as silicon carbide or gallium nitride.
Wet EtchingDry Etching
highly selectiveeasy to start and stop
no damage to substrateless sensitive to small changes in temperature
cheapermore repeatable
slowerfaster
may have anisotropies
fewer particles in environment

High aspect ratio structures

Dry etching is currently used in semiconductor fabrication processes due to its unique ability over wet etch to do anisotropic etching to create high aspect ratio structures.

Hardware design

The dry etching hardware design basically involves a vacuum chamber, special gas delivery system, RF waveform generator and an exhaust system.

History

The anisotropic dry etching process was developed by Hwa-Nien Yu at the IBM T.J. Watson Research Center in the early 1970s. It was used by Yu with Robert H. Dennard to fabricate the first micron-scale MOSFETs in the 1970s.